Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model — Gyujun Jeong, Sungwon Cho, Minji Shon, Namhoon Kim, Woohyun Hwang, Kwangyou Seo, Suhwan Lim, Wanki Kim, Daewon Ha, Prasanna Venkatesan, Kihang Youn, Ram Cherukuri, Yiyi Wang, Suman Datta, Asif Khan, Shimeng Yu | Kutubxona